TY  - BOOK
AU  - Wang,Laung-Terng
AU  - Stroud,Charles E.
AU  - Touba,Nur A.
TI  - System-on-chip Test Architectures: Nanometer Design for Testability 
SN  - 9780123739735 (hardcover : alk. paper)
AV  - TK7895.E42 S978 2008
U1  - 621.39/5 22
PY  - 2008///
CY  - Amsterdam, Boston
PB  - Morgan Kaufmann Publishers
KW  - Systems on a chip
KW  - Testing
KW  - Integrated circuits
KW  - Very large scale integration
KW  - Design
N1  - Includes bibliographical references and index
UR  - http://www.loc.gov/catdir/toc/ecip0719/2007023373.html
UR  - http://www.loc.gov/catdir/enhancements/fy0808/2007023373-d.html
ER  -