System-on-chip Test Architectures : Nanometer Design for Testability / edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba.
Material type:
TextSeries: The Morgan Kaufmann series in systems on siliconPublication details: Amsterdam ; Boston : Morgan Kaufmann Publishers, c2008.Description: xxxvi, 856 p. : ill. ; 25 cmISBN: - 9780123739735 (hardcover : alk. paper)
- 012373973X (hardcover : alk. paper)
- 621.39/5 22
- TK7895.E42 S978 2008
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Nairobi | TK7895.E42 S978 2008 (Browse shelf(Opens below)) | 2 | Available | 021071 |
Includes bibliographical references and index.
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